Name: Measurement System Error Analysis: Analyzing and Reducing Measurement Errors In Test Systems (en Inglés)
Price: 42.00 USD
Availability: InStock
Author: Peralta, Mike
ISBN: 9781470054052

portada Measurement System Error Analysis: Analyzing and Reducing Measurement Errors In Test Systems (en Inglés)

Formato

Libro Físico

Autor

Mike Peralta

Editorial

Createspace Independent Publishing Platform

Idioma

Inglés

N° páginas

208

Encuadernación

Tapa Blanda

Dimensiones

28.0 x 21.6 x 1.1 cm

Peso

0.49 kg.

ISBN13

9781470054052

Categorías

Producción e ingeniería industrial

Measurement System Error Analysis: Analyzing and Reducing Measurement Errors In Test Systems (en Inglés)

Mike Peralta (Autor) · Createspace Independent Publishing Platform · Tapa Blanda

Libro Físico

$ 42.00

$ 84.01

Ahorras: $ 42.00

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Envío normal

Origen: Estados Unidos (Costos de importación incluídos en el precio)

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Reseña del libro "Measurement System Error Analysis: Analyzing and Reducing Measurement Errors In Test Systems (en Inglés)"

The goal of this book is to carefully define and derive the statistical relationships relevant to the errors that do and can occur in measurement systems. The emphasis is on test systems employed in manufacturing. However, the statistical techniques presented are general and can be applied to any field of science, engineering, or any field which employs the mathematics of statistics to gather and analyze information. As will be explained throughout this book, knowing the statistics of measurement error for test equipment will allow us to know and improve test accuracy and precision, which in turn, will allow us to greatly improve: Product Quality, Test Productivity, and Product Yields. The center of this work is the "Test Capability Study" this is a spreadsheet based analysis that can quickly be set up and give an estimate of the overall uncertainty of a measurement based on a sampling of test systems or test configurations. The "Test Capability Study" is a streamlined and more efficient form of the "Gage R & R Study." Also covered is the "Propagation of Errors" (POE) analysis to first and second order. The first order POE is commonly treated in many fine books, but the second order POE is rarely treated. For those familiar with first order POE I think you will find it a real treat to study the second order POE as it will help you get a deeper and more accurate understanding of POE. As well as treating measurement errors, second order POE can accurately analyze variation contributions to product distributions as well as other variations in physical systems that can be defined mathematically.